09A2 U50 - Spectroscopy

  • Surface Characterization System (TLS / BL 09A2)

  Surface Characterization Station  (SCS) is an ultrahigh vacuum system (UHV,(~2x10-10 torr) ) which equipped with X-ray, ultra-violet source and electron energy analyzer (SCIENTA R3000) for X-ray (XPS), ultra-violet (UPS) photoelectron spectroscopy. When connected with BL  09A, we can perform  synchrotron photoelectron spectroscopy and X-ray absorption spectroscopy (NEXAFS) in total (TEY)/Auger (AES) electron yield mode.  

  The station is composed of several UHV chambers for in-situ metal, organic deposition thin films and surface characterizations. Materials are deposited from e-beam bombardment and thermal effusion cells that provide high purity metallic and molecular beams that are directed toward crystalline substrates. In  laboratory, we utilize evaporation guns for the deposition  of metallic magnetic (Cr, Co, and Ni ) thin films, noble metal (Pt, Pd and Au) films, ultrathin oxide films, and organic thin films.



Find a Beamline

09A2 Home



BL Schedule

Optical Layout




+886-3-578-0281 Ext. 1102

BL Spokesperson

Hsu, Yao-Jane (許瑤真)
+886-3-578-0281 Ext. 7311

BL Manager/Local Contact

Shiu, Hung-Wei (許紘瑋)
+886-3-578-0281 Ext. 7119


  • X-ray Photoelectron Spectroscopies (XPS)


  • Biochemistry

General Information

  • Source: U50
  • Energy Range: 60~1400 ev
  • Focused Spot Size: 0.1 × 0.15 mm
  • Status: Operational

National Synchrotron Radiation Research Center

101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu, Taiwan 30076