- Surface Characterization System (TLS / BL 09A2)
Surface Characterization Station (SCS) is an ultrahigh vacuum system (UHV,(~2x10-10 torr) ) which equipped with X-ray, ultra-violet source and electron energy analyzer (SCIENTA R3000) for X-ray (XPS), ultra-violet (UPS) photoelectron spectroscopy. When connected with BL 09A, we can perform synchrotron photoelectron spectroscopy and X-ray absorption spectroscopy (NEXAFS) in total (TEY)/Auger (AES) electron yield mode.
The station is composed of several UHV chambers for in-situ metal, organic deposition thin films and surface characterizations. Materials are deposited from e-beam bombardment and thermal effusion cells that provide high purity metallic and molecular beams that are directed toward crystalline substrates. In laboratory, we utilize evaporation guns for the deposition of metallic magnetic (Cr, Co, and Ni ) thin films, noble metal (Pt, Pd and Au) films, ultrathin oxide films, and organic thin films.
